April 30, 2020
Dr. K.K. Nagarajan – Associate Professor
EEE
Dr. K.K. Nagarajan, Associate Professor in the Department of Electrical and Electronics Engineering has 23 years of teaching experience and 2 years of industrial experience. He received his B.E (EEE) degree from Madurai Kamaraj University, M.E. (Electronics) from Madras Institute of Technology (MIT), Chennai and Ph.D from Anna University. During his Ph.D, he has worked on DST funded project in the area of Process variation in FinFETs, under the guidance of Dr. R. Srinivsan, Professor, IT Dept, SSNCE. Prior to joining SSN, he was a member of the Electrical Engineering faculty at Bannari Amman Institute of Technology, Sathyamangalam fromApril 2000 to July 2004. He has been with SSN since September 2004. Nagarajan has guided students in developing and maintaining the Academic Feedback System which is currently used by the institution for collecting feedback from students. He was also involved in the e-learning initiatives of the college and had developed MCA and MBA departments’ intranet portal GARC. He is an active member of IEEE Electron Devices Society and APS. He has been involved in the organization of FDPs and conferences Nagarajan has been associated with the following industrial collaborations undertaken by SSN Institutions. This includes
- Off-campus training of Entry-Level Training recruits (ELT) of Cognizant Technology Solutions (CTS) Ltd and HCL Technologies Ltd.
- Development of training material i.e Learning Assets Development Project for CTS
- Curriculum Development and delivery for “Mobile Computing” to Chennai Business School (CBS)
Funded Research Projects
Funded Research Projects
- Co- PrincipalInvestigator (Co-PI), “Radiation resilient RF receiver front end components through SIGs BICMOS: Design and validation”, Extramural Research Grant, by Board of Research in Nuclear Sciences (BRNS), Funded grant amount: Rs. 31.47 lakhs, Project timeline: Mar 2020 – Mar 2023
- Co- PrincipalInvestigator (Co-PI), “Study of Soft Errors in 65nm CMOS SRAM and 30 nm FinFET, MIGFET, Tunnel FET and JunctionlessFET based 6T SRAMs using TCAD Simulations”, Extramural Research Grant, by Defence Research Development Organization (DRDO), Funded grant amount: Rs. 30.47 lakhs, Project timeline: Mar 2012 – Mar 2015
- Principal Investigator (PI), “Ergonomics through Image Processing”, Funded by SSN Trust, Grant Amount: Rs. 0.60 Lakhs , 2014-2016
- Co- Principal Investigator (Co-PI), “Building a streaming air quality monitoring system and analyse trend for healthy living”, Funded by SSN Trust, Grant Amount: Rs. 3 Lakhs, 2019-2022.
- Co- Principal Investigator (Co-PI), “Remote monitoring and spatio-temporal mapping of ground water pollutant’s plume movement around solid waste dump yard”, Funded by SSN Trust, 2019-2022
Awards
Awards
- BEST TEACHER AWARD from SSNI for the years
- (2011-12)
- (2010-11) and
- (2008-09)
- BEST PAPER AWARD
- (IWNANO -Dec 2011),
- (ICVCI – April 2011) and
- (EMCON 2009)
Selected Publications
Selected Publications
- Ramya Mohan, K K Nagarajan, 2022, ‘Investigation of Single Event Transients on RingFET using 3D TCAD Simulations‘, Silicon, 1-12, 2022
- K Sumathi, KK Nagarajan, R Srinivasan, 2021, ‘Sensitivity Analysis of Gallium Nitride Quantum Dot LED‘, Journal of Nanoelectronics and Optoelectronics 16 (8), 1204-1214, 2021
- R Archana, BS Sreeja, KK Nagarajan, S Radha, P BalajiBhargav, C Balaji, 2020, Development of highly sensitive Ag NPs decorated graphene FET sensor for detection of glucose concentration, Journal of Inorganic and Organometallic Polymers and Materials 30, 3818-3825, 2020
- P Rajendiran, KK Nagarajan, R Srinivasan, 2020, Investigation of heavy-ion strikes on a fin field-effect transistor-based low-noise amplifier, Semiconductor Science and Technology 35 (12), 125028, 2020
- Krishnamurthy, Vallidevi*, Kannappan P. Gopinath, Krishnan K. Nagarajan, 2020, ‘ Water Pollution Monitoring through Remote Sensing‘, Current Analytical Chemistry, 1-13, 2020
- Vinodhkumar, N, Bhuvaneshwari, YV, Nagarajan, KK & Srinivasan R, 2015, ‘Heavy-ion irradiation study in SOI-based and bulk-based junctionlessFinFETs using 3D-TCAD simulation’, Microelectronics Reliability, Vol.55, Issue 12, pp. 2647-2653, Dec 2015. DOI: http://dx.doi.org/10.1016/j.microrel.2015.09.011